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    <title>Metrology World.com News</title>
    <description>News Articles</description>
    <link>http://www.metrologyworld.com/</link>
    <pubDate>Wed, 07 Jul 2010 12:05:45 GMT</pubDate>
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      <title>Compact Optical Multi-Meter Ideal For Field Testing</title>
      <description>GAO Fiber Optics has announced the release of an easy-to-use optical multi-meter intended to measure optical loss and to check the performance of optical parts.</description>
      <link>http://www.metrologyworld.com/article.mvc/Compact-Optical-Multi-Meter-Ideal-For-Field-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 07 Jul 2010 12:05:45 GMT</pubDate>
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      <title>Honeywell's Zephyr Airflow Sensors Deliver The Industry's Most Accurate Airflow Reading</title>
      <description>Mouser Electronics, Inc., known for its rapid introduction of the newest products, recently announced it is stocking the Honeywell Zephyr Digital Airflow Sensors, HAF Series (High Accuracy) that provide the industry's most accurate measurement - within 2.5%</description>
      <link>http://www.metrologyworld.com/article.mvc/Honeywells-Zephyr-Airflow-Sensors-Deliver-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 06 Jul 2010 12:32:00 GMT</pubDate>
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      <title>Stalker Radar's New Pro II Sport Radar Goes Supersonic. </title>
      <description>Stalker Radar, The World Leader in Speed Measurement, is introducing the first sports radar capable of measuring the speed of supersonic objects, the Stalker Pro II</description>
      <link>http://www.metrologyworld.com/article.mvc/Stalker-Radars-New-Pro-II-Sport-Radar-Goes-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 06 Jul 2010 12:18:00 GMT</pubDate>
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      <title>FARO And Autodesk Collaborate To Add Support For Point Cloud Data To AutoCAD 2011</title>
      <description>Autodesk, Inc., a world leader in 2D and 3D design, engineering and entertainment software for the manufacturing, building and construction, and media and entertainment markets, and FARO, the world's leading provider of portable measurement and imaging solutions, announced their collaboration to add direct integration of point cloud data to AutoCAD 2011 software</description>
      <link>http://www.metrologyworld.com/article.mvc/FARO-And-Autodesk-Collaborate-To-Add-Support-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 06 Jul 2010 11:22:00 GMT</pubDate>
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      <title>Multi-Functional E1 Service Tester Meets Various Test Needs</title>
      <description>GAO Tek Inc.  has launched this E1 service tester designed for technicians involved in the installation and maintenance of E1 digital networks. With this powerful handheld instrument you can easily verify quality-of-service in your networks</description>
      <link>http://www.metrologyworld.com/article.mvc/Multi-Functional-E1-Service-Tester-Meets-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 05 Jul 2010 12:16:00 GMT</pubDate>
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      <title>QuEST Forum Publishes New Edition Of TL 9000 Quality Management System Measurements Handbook</title>
      <description>Today QuEST Forum published the TL 9000 Quality Management System Measurements Handbook Release 4.5, the latest edition of the global quality standard used by the telecommunications industry</description>
      <link>http://www.metrologyworld.com/article.mvc/QuEST-Forum-Publishes-New-Edition-Of-TL-9000-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 01 Jul 2010 11:59:00 GMT</pubDate>
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      <title>NeoMetrix Signs With Creaform To Distribute HandyProbe Portable CMM</title>
      <description>NeoMetrix Technologies, Inc, a leader in 3D scanning and reverse engineering has signed a distribution agreement with Creaform, Inc. to distribute the HandyProbe portable CMM system in the Southeastern U.S.</description>
      <link>http://www.metrologyworld.com/article.mvc/NeoMetrix-Signs-With-Creaform-To-Distribute-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 29 Jun 2010 11:55:00 GMT</pubDate>
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      <title>New Partners In LayTec's Distribution Network For PV!</title>
      <description>LayTec is happy to announce the expansion of the distribution network. To meet the increasing interest in LayTec's in-line metrology systems for photovoltaic applications, we will now cooperate with two new and very qualified distribution partners in Asia.</description>
      <link>http://www.metrologyworld.com/article.mvc/New-Partners-In-LayTecs-Distribution-Network-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 28 Jun 2010 11:37:00 GMT</pubDate>
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      <title>Jordan Valley Semiconductors Ltd. Receives $10M In Capacity Repeat Order For Its JVX6200 Metrology Production Tools From Tier One Semiconductors Manufacturer</title>
      <description>Sales momentum continues as Jordan Valley Semiconductors Ltd. (JVS), a leading supplier of advanced process control X-Ray based metrology systems for the manufacturing of semiconductors and high brightness LED, announced today the receipt of a $10M capacity order of multiple JVX6200i Metrology tools from a tier one semiconductor manufacturer</description>
      <link>http://www.metrologyworld.com/article.mvc/Jordan-Valley-Semiconductors-Ltd-Receives-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 24 Jun 2010 11:39:00 GMT</pubDate>
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      <title>Automatic Form And Roughness Measurement In One Pass</title>
      <description>Hommel-Etamic will demonstrate at IMTS 2010, Booth E-4952, Roundscan, a specially developed scanning system that combines automatic measurement of form, cylindricity and roughness characteristics in one measuring instrument</description>
      <link>http://www.metrologyworld.com/article.mvc/Automatic-Form-And-Roughness-Measurement-In-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 24 Jun 2010 08:45:00 GMT</pubDate>
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      <title>CyberOptics Semiconductor To Present WaferSense Auto Gapping System (AGS300) At Semicon West</title>
      <description>CyberOptics Semiconductor will feature its WaferSense Auto Gapping System (AGS300) along with their full line of WaferSense wireless metrology devices (cyberopticssemi.com/products/wafersense/ags/) during Semicon West in booth 911 South.</description>
      <link>http://www.metrologyworld.com/article.mvc/CyberOptics-Semiconductor-To-Present-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Mon, 14 Jun 2010 11:51:00 GMT</pubDate>
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      <title>Rentrak Signs Contract With WFAA For Its StationView Essentials Local Market Measurement Service</title>
      <description>&lt;a href="http://www.rentrak.com"target="new"&gt;Rentrak Corporation&lt;/a&gt; (Nasdaq: &lt;a href="http://www.marketwatch.com/investing/stock/rent"target="new"&gt;RENT&lt;/a&gt;), a leader in multi-screen media measurement serving the entertainment and advertising industries, today announced it has signed a contract with Dallas-Fort Worth ABC affiliate WFAA</description>
      <link>http://www.metrologyworld.com/article.mvc/Rentrak-Signs-Contract-With-WFAA-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 09 Jun 2010 11:58:00 GMT</pubDate>
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      <title>Nova Adds Additional Memory Manufacturer To Its Stand-Alone Metrology Customer Base</title>
      <description>Nova Measuring Instruments Ltd. (NASDAQ: &lt;a href="http://studio-5.financialcontent.com/prnews?Page=Quote&amp;Ticker=NVMI" target="new"&gt;NVMI&lt;/a&gt;
) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced a first standalone optical CD metrology order from a large DRAM manufacturer. </description>
      <link>http://www.metrologyworld.com/article.mvc/Nova-Adds-Additional-Memory-Manufacturer-To-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 09 Jun 2010 10:10:42 GMT</pubDate>
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      <title>How You Measure The Difference...Can Make The Difference</title>
      <description>Ashcroft engineers apply decades of
expertise to the design of instrumentation
to measure, monitor and control differential
pressure (d/p)</description>
      <link>http://www.metrologyworld.com/article.mvc/How-You-Measure-The-DifferenceCan-Make-The-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 09 Jun 2010 09:51:00 GMT</pubDate>
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      <title>Leading Semiconductor Equipment Manufacturer Selects Crossing Automation's Spartan EFEM For Second Generation Metrology Tool</title>
      <description>Crossing Automation, Inc., a leading supplier of efficient, cost-effective front-end and back-end automation solutions and engineering services to high volume semiconductor equipment manufacturers, today announced that its Spartan&amp;trade; equipment front end module (EFEM) has been selected by a leading manufacturer of lithography and metrology equipment for its second-generation metrology tool</description>
      <link>http://www.metrologyworld.com/article.mvc/Leading-Semiconductor-Equipment-Manufacturer-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 08 Jun 2010 09:15:00 GMT</pubDate>
    </item>
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      <title>Columbia Marking Tool, Inc. Introduces 'I-Mark' The New Generation Of Software And Controllers For Marking Machines </title>
      <description>Columbia Marking Tools, Inc. has been building tools, machines, and systems as well as developing new marking processes for placing identification marks in parts since 1960</description>
      <link>http://www.metrologyworld.com/article.mvc/Columbia-Marking-Tool-Inc-Introduces-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Fri, 04 Jun 2010 09:34:00 GMT</pubDate>
    </item>
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      <title>Renishaw Advances Technology Leadership In Laser Interferometer Calibration With The "Lean Design" XL-80 System</title>
      <description>Renishaw advances technology leadership in laser interferometer calibration with the "lean design" XL-80 system.  The new design allows a 4X faster slew rate, 10X higher dynamic data capture rate, and industry's best total system accuracy in a smaller, lighter and more portable package</description>
      <link>http://www.metrologyworld.com/article.mvc/Renishaw-Advances-Technology-Leadership-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Fri, 04 Jun 2010 09:24:00 GMT</pubDate>
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      <title>GKS Celebrates 29 Years In Business With Its 20,000th Project</title>
      <description>GKS Global Services, a global provider of metrology services since 1981, recently celebrated 29 years in business by completing its 20,000th project.  Averaged over the life of the company, GKS has performed nearly 700 projects per year on a sustained, ongoing basis, an amazing feat in the recent adverse business climate</description>
      <link>http://www.metrologyworld.com/article.mvc/GKS-Celebrates-29-Years-In-Business-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Thu, 03 Jun 2010 10:23:00 GMT</pubDate>
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      <title>EAZY-CAL Signal Conditioner For LVDT Position Sensors</title>
      <description>Macro Sensors announces the release of EAZY-CAL, the most user-friendly LVDT signal conditioner currently on the market</description>
      <link>http://www.metrologyworld.com/article.mvc/EAZY-CAL-Signal-Conditioner-For-LVDT-Position-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Wed, 02 Jun 2010 05:31:00 GMT</pubDate>
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      <title>Umetrics Announces The Release Of FabStat Version 12 </title>
      <description>Umetrics announces the release of version 12 of FabStat.  Combining world-class multivariate techniques with semiconductor FDC know-how, Umetrics provides FabStat based on SIMCA-P+ multivariate platform. From the fab floor to the corner office, FabStat delivers real-time FDC capability and integrates into existing data collection infrastructure</description>
      <link>http://www.metrologyworld.com/article.mvc/Umetrics-Announces-The-Release-Of-FabStat-0001?atc~c=771+s=773+r=001+l=a</link>
      <pubDate>Tue, 01 Jun 2010 10:30:00 GMT</pubDate>
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