Current Headlines

  1. Honeywell’s Zephyr Airflow Sensors Deliver The Industry’s Most Accurate Airflow Reading
    7/7/2010
    Mouser Electronics, Inc., known for its rapid introduction of the newest products, recently announced it is stocking the Honeywell Zephyr Digital Airflow Sensors, HAF Series (High Accuracy) that provide the industry's most accurate measurement – within 2.5%
  2. Stalker Radar's New Pro II Sport Radar Goes Supersonic.
    7/7/2010
    Stalker Radar, The World Leader in Speed Measurement, is introducing the first sports radar capable of measuring the speed of supersonic objects, the Stalker Pro II
  3. Multi-Functional E1 Service Tester Meets Various Test Needs
    7/7/2010
    GAO Tek Inc. has launched this E1 service tester designed for technicians involved in the installation and maintenance of E1 digital networks. With this powerful handheld instrument you can easily verify quality-of-service in your networks
  4. Compact Optical Multi-Meter Ideal For Field Testing
    7/7/2010
    GAO Fiber Optics has announced the release of an easy-to-use optical multi-meter intended to measure optical loss and to check the performance of optical parts.
  5. QuEST Forum Publishes New Edition Of TL 9000 Quality Management System Measurements Handbook
    7/7/2010
    Today QuEST Forum published the TL 9000 Quality Management System Measurements Handbook Release 4.5, the latest edition of the global quality standard used by the telecommunications industry
  6. NeoMetrix Signs With Creaform To Distribute HandyProbe Portable CMM
    7/7/2010
    NeoMetrix Technologies, Inc, a leader in 3D scanning and reverse engineering has signed a distribution agreement with Creaform, Inc. to distribute the HandyProbe portable CMM system in the Southeastern U.S.
  7. CyberOptics Semiconductor To Present WaferSense Auto Gapping System (AGS300) At Semicon West
    7/7/2010
    CyberOptics Semiconductor will feature its WaferSense Auto Gapping System (AGS300) along with their full line of WaferSense wireless metrology devices (cyberopticssemi.com/products/wafersense/ags/) during Semicon West in booth 911 South.
  8. Jordan Valley Semiconductors Ltd. Receives $10M In Capacity Repeat Order For Its JVX6200 Metrology Production Tools From Tier One Semiconductors Manufacturer
    7/7/2010
    Sales momentum continues as Jordan Valley Semiconductors Ltd. (JVS), a leading supplier of advanced process control X-Ray based metrology systems for the manufacturing of semiconductors and high brightness LED, announced today the receipt of a $10M capacity order of multiple JVX6200i Metrology tools from a tier one semiconductor manufacturer
  9. New Partners In LayTec's Distribution Network For PV!
    7/7/2010
    LayTec is happy to announce the expansion of the distribution network. To meet the increasing interest in LayTec's in-line metrology systems for photovoltaic applications, we will now cooperate with two new and very qualified distribution partners in Asia.
  10. FARO And Autodesk Collaborate To Add Support For Point Cloud Data To AutoCAD 2011
    7/7/2010
    Autodesk, Inc., a world leader in 2D and 3D design, engineering and entertainment software for the manufacturing, building and construction, and media and entertainment markets, and FARO, the world's leading provider of portable measurement and imaging solutions, announced their collaboration to add direct integration of point cloud data to AutoCAD 2011 software

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