Portable ShuttlePix Digital Microscope For Recording High-Resoultion Images

Brighton, MI - Nikon Metrology, Inc. announces the release of its new ShuttlePix P-400R Digital Microscope, made for inspection, observation, simple measurement and recording of high-resolution images. For on-site analysis of samples, it serves as a handheld microscope that shoots high-resolution images as quickly and easily as taking pictures with a digital camera. For stationary use, the ShuttlePix microscope interfaces seamlessly with a motorized stand. With the equipped 17-inch touchscreen monitor, the user can easily control, display, measure or print images. The microscope also connects to a standard PC or laptop running dedicated 3D image reconstruction software.

"The versatility of the ShuttlePix system means the user can bring the microscope to large samples, such as an aircraft frame, turbine casting or pipe work that often cannot be reached with a standard microscope," says Bob Wasilesky, Senior Vice President, Nikon Metrology Inc. "The unique ShuttlePix technology supports a wide range of inspection tasks in automotive, electronics, aerospace and other industries. In combination with its imaging capabilities, it's a very versatile, extremely useful piece of equipment."

The ShuttlePix addresses the market need for an easy-to-use device that magnifies samples and can record and save images as digital files. Nikon combined its technological excellence in optical technology with its expertise in digital image processing technology to enable the creation of the ShuttlePix.

The stand is equipped with a motorized Z, which does not require a PC for control. Operation of the stand is simple, allowing extended depth of focus (EDF) image capture with the touch of a button.

ShuttlePix offers a 20x zoom with a magnification range of 20x– 400x on a 17-inch monitor, which is double that of competitors' models. For optimal lighting, the zoom head has built-in 4 section LED ring illumination. The ShuttlePix will be exhibited September 13 – 18 at IMTS 2010 in Chicago, and will become available in December 2010.

SOURCE: Nikon Metrology, Inc.