LATEST HEADLINES

• Medical Manufacturing Technologies (MMT) Unveils The Glebar P5K Gauging System: Revolutionizing Guidewire Measurement And Metrology Processes With Unmatched Speed And Accuracy

  9/9/2025

  Medical Manufacturing Technologies (MMT), a leading global provider of medical device manufacturing services and solutions, proudly announces the launch of the ground-breaking, patented Glebar P5K Gauging System.

• Onto Innovation Launches Next Generation OCD Metrology Platform To Enable Process Control For Advanced AI Devices

  9/9/2025

  Onto Innovation Inc. today introduced the Atlas G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes.

• Advantest Introduces Advanced Mask CD-SEM 'E3660'

  9/9/2025

  Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the release of its next-generation CD-SEM^* E3660, engineered for the dimensional metrology of photomasks and EUV masks used in cutting-edge semiconductor manufacturing.

• EV Group Achieves Breakthrough In Hybrid Bonding Overlay Control For Chiplet Integration

  9/8/2025

  EV Group (EVG), a leading provider of innovative process solutions and expertise serving leading-edge and future semiconductor designs and chip integration schemes, today unveiled the EVG®40 D2W—the first dedicated die-to-wafer overlay metrology platform to deliver 100 percent die overlay measurement on 300-mm wafers at high precision and speeds needed for production environments.

• ReLogic Research Launches ReLogic3D, Bringing Metrology-Grade 3D Scanning Solutions To U.S. Industries

  9/5/2025

  ReLogic Research today announced the launch of ReLogic3D, a new distribution and solutions company making high-precision 3D scanning technology more accessible to U.S. industries.

• Mitutoyo Introduces Sensible Measurement For Everyone With The New Bold Compact QM-Fit Measurement System

  9/4/2025

  Mitutoyo America Corporation, the world leader in metrology instruments, introduces the QM-Fit Smart Vision System. The QM-Fit represents a BOLD step forward in optical metrology.